Kore Systems:
Custom SIMS

Optical Viewing.

High resolution viewing optics

In surface analysis, it is extremely helpful to view the sample optically to assist in navigation and to determine the correct location for subsequent analysis. Kore has developed a system which can be interfaced to any TOF-SIMS system, and has the following capabilities:

  • Zoom from ~3mm field of view to 400µm field of view.
  • High lateral optical resolution at high magnification (<5µm).
  • A long working distance of 175 mm ideally suited to UHV stainless steel chambers where it is not always possible to locate a camera near to the sample.
  • Mounting onto a 70mm OD CF window.
  • A colour camera mounted on the microscope.
  • Monitor display.
  • Image capture with a suitable image capture board.
  • Cold, dichroic halogen illuminator mounted on a 70mm OD CF window with power supply.

Kore Technology is a centre of excellence in time-of-flight mass spectrometer technology and has a very strong R&D capability in terms of its personnel, all of whom have been heavily involved in a variety of analytical instrumentation development programmes.


If you have any questions please feel free to contact us via our online form or telephone us for more information, we offer a wide range of products and services to suit your requirements.


If you wish to purchase our products, please contact Kore sales at sales@kore.co.uk, or call +44 (0)1353 653030.

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