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High Lateral Resolution, Long Working Distance Viewing Optics for UHV Chambers

Photo of long working distance viewing micrscope

In surface analysis, it is extremely helpful to view the sample optically to assist in navigation and to determine the correct location for subsequent analysis. Kore has developed a viewing system with the following capabilities:

Thumbnail sketch

Please click on the thumbnail sketch to view a larger schematic with dimensions (in PDF format for easy zooming).


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Last updated: 17:08 05/02/2014

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