(most pages are English only)

SurfaceSeer demo facility

The SurfaceSeer: Surface Analysis by TOF-SIMS

SurfaceSeer is a compact, affordable, TOF-SIMS designed for ease of use and speed of data acquisition. All the spectrometer tuning has been pre-set in the electronics, so that the surface chemistry of insulating, metals and semiconductor samples can be determined quickly and efficiently.

The SurfaceSeer is available in two forms:

'SurfaceSeer-S'

System photo

The SurfaceSeer-S is designed to be a 'work horse' for spectro­scopy in both positive and negative TOF-SIMS modes, and has a mass resolution of better than 2500.

'SurfaceSeer-I'

Photo

The SurfaceSeer-I is designed to produce chemical maps in both positive and negative TOF-SIMS modes with an analytical spatial resolution of around 0.5µm and a mass resolution of better than 3000.

Both instruments provide the power of surface analysis, at less than one quarter of the cost of high-end research TOF-SIMS instruments.


Top

Last updated: 17:10 12/03/2014

© Kore Technology Limited 2014