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Materials R&D

SIMS using the SurfaceSeer

Static SIMS is an amazingly sensitive surface analysis technique, being able to gather a detailed mass spectrum whilst consuming a small fraction of a monolayer of sample. The molecules analysed come from the top few monolayers of solid, the key region of the material when considering properties such as adhesion or catalysis. Some example test data is available for analysis on metal, silicon, polymer and paper substrates.


Last updated: 12:09 30/01/2014

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