Post-Ionised TOF-SIMS Apparatus For University of Sherbrooke, Canada
The University of Sherbrooke in Canada is constructing an instrument that employs a laser to ionise and detect neutral species evolving from sample surfaces in a vacuum under the influence of low energy electron beams.
Kore has designed equipment based on our R-500 analyser to join directly to other vacuum instrumentation at the University of Sherbrooke (Canada), under the supervision of Dr. Andrew Bass. The Kore instrument utilises ion extraction optics suitable for laser post-ionisation coupled with the Kore R-500 Time-of Flight (TOF) analyser and a 40mm dual micro channel plate (DMCP) detector and pre-amplifier. It also has a full set of high voltage control electronics, a digital delay generator and a control computer with mass spectral software. The variable magnification lensing system has been designed specifically to accommodate post-ionisation experiments: at low magnification the lens collects efficiently from the large volume ionised plume created by the laser. The extraction gap between sample and extractor in these circumstances is designed to be 10mm. In this mode the beam transferred down the secondary column is considerable larger than in a standard SIMS mode, and an octopole element permits optimised shaping and steering of the beam with minimal distortion of the beam. The extraction lens can also be operated at high magnification for secondary ion mass spectrometry (SIMS) mode.
The instrument was delivered in August 2003.
Last updated: 12:06 25/02/2014
© Kore Technology Limited 2014